Nicole Rowsey: Difference between revisions
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(New page: * '''Nicole Rowsey''' - 2011 - Device Simulation: Total Dose Radiation Effect in Oxides, MOS-Based Quantum Dot / Charge Qubit Devices, Multi-Gate Devices nrowsey at ufl.edu) |
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'''Nicole Rowsey''' - 2011 - nrowsey at ufl.edu | |||
Device Simulation: | |||
*Total Dose Radiation Effects in Oxides | |||
*MOS-Based Quantum Dot / Charge Qubit Devices | |||
*Multi-Gate Devices (FinFETs) | |||
Latest revision as of 21:35, 28 September 2010
Nicole Rowsey - 2011 - nrowsey at ufl.edu
Device Simulation:
- Total Dose Radiation Effects in Oxides
- MOS-Based Quantum Dot / Charge Qubit Devices
- Multi-Gate Devices (FinFETs)